| 000 | 00912 a2200265 4500 | ||
|---|---|---|---|
| 005 | 20250516121403.0 | ||
| 264 | 0 | _c20130815 | |
| 008 | 201308s 0 0 eng d | ||
| 022 | _a1879-2723 | ||
| 024 | 7 |
_a10.1016/j.ultramic.2012.08.003 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aLiu, Zhuang | |
| 245 | 0 | 0 |
_aReflection-based near-field ellipsometry for thin film characterization. _h[electronic resource] |
| 260 |
_bUltramicroscopy _cJan 2013 |
||
| 300 |
_a26-34 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 650 | 0 | 4 |
_aNanostructures _xultrastructure |
| 650 | 0 | 4 |
_aSpectroscopy, Near-Infrared _xmethods |
| 700 | 1 | _aZhang, Ying | |
| 700 | 1 | _aKok, Shaw Wei | |
| 700 | 1 | _aNg, Boon Ping | |
| 700 | 1 | _aSoh, Yeng Chai | |
| 773 | 0 |
_tUltramicroscopy _gvol. 124 _gp. 26-34 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.ultramic.2012.08.003 _zAvailable from publisher's website |
| 999 |
_c22255245 _d22255245 |
||