000 | 01076 a2200325 4500 | ||
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005 | 20250516114136.0 | ||
264 | 0 | _c20130709 | |
008 | 201307s 0 0 eng d | ||
022 | _a1539-4794 | ||
024 | 7 |
_a10.1364/ol.37.003855 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aDel Rosso, T | |
245 | 0 | 0 |
_aLong-path second-harmonic interferometer with nanosecond time resolution: reliable diagnostic tool for electron density measurement in pulsed plasma devices. _h[electronic resource] |
260 |
_bOptics letters _cSep 2012 |
||
300 |
_a3855-7 p. _bdigital |
||
500 | _aPublication Type: Journal Article | ||
700 | 1 | _aGiammanco, F | |
700 | 1 | _aAnderson, M G | |
700 | 1 | _aConti, F | |
700 | 1 | _aBalvis, A | |
700 | 1 | _aIsakov, I | |
700 | 1 | _aMatvienko, V | |
700 | 1 | _aStrashnoy, G | |
700 | 1 | _aWaggoner, W | |
700 | 1 | _aBonelli, L | |
700 | 1 | _aPaganini, E | |
700 | 1 | _aBinderbauer, M W | |
773 | 0 |
_tOptics letters _gvol. 37 _gno. 18 _gp. 3855-7 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1364/ol.37.003855 _zAvailable from publisher's website |
999 |
_c22163556 _d22163556 |