000 01098 a2200325 4500
005 20250516112846.0
264 0 _c20121123
008 201211s 0 0 eng d
022 _a1079-7114
024 7 _a10.1103/PhysRevLett.108.196102
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aMeyer, Jannik C
245 0 0 _aAccurate measurement of electron beam induced displacement cross sections for single-layer graphene.
_h[electronic resource]
260 _bPhysical review letters
_cMay 2012
300 _a196102 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aEder, Franz
700 1 _aKurasch, Simon
700 1 _aSkakalova, Viera
700 1 _aKotakoski, Jani
700 1 _aPark, Hye Jin
700 1 _aRoth, Siegmar
700 1 _aChuvilin, Andrey
700 1 _aEyhusen, Sören
700 1 _aBenner, Gerd
700 1 _aKrasheninnikov, Arkady V
700 1 _aKaiser, Ute
773 0 _tPhysical review letters
_gvol. 108
_gno. 19
_gp. 196102
856 4 0 _uhttps://doi.org/10.1103/PhysRevLett.108.196102
_zAvailable from publisher's website
999 _c22127964
_d22127964