000 01247 a2200349 4500
005 20250516100025.0
264 0 _c20121019
008 201210s 0 0 eng d
022 _a1094-4087
024 7 _a10.1364/OE.20.014090
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aMazumder, Nirmal
245 0 0 _aPolarization-resolved second harmonic generation microscopy with a four-channel Stokes-polarimeter.
_h[electronic resource]
260 _bOptics express
_cJun 2012
300 _a14090-9 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't
650 0 4 _aEquipment Design
650 0 4 _aEquipment Failure Analysis
650 0 4 _aMicroscopy, Confocal
_xinstrumentation
650 0 4 _aReproducibility of Results
650 0 4 _aScanning Laser Polarimetry
_xinstrumentation
650 0 4 _aSensitivity and Specificity
700 1 _aQiu, Jianjun
700 1 _aForeman, Matthew R
700 1 _aRomero, Carlos Macías
700 1 _aHu, Chih-Wei
700 1 _aTsai, Han-Ruei
700 1 _aTörök, Peter
700 1 _aKao, Fu-Jen
773 0 _tOptics express
_gvol. 20
_gno. 13
_gp. 14090-9
856 4 0 _uhttps://doi.org/10.1364/OE.20.014090
_zAvailable from publisher's website
999 _c21878989
_d21878989