| 000 | 00940 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250516093757.0 | ||
| 264 | 0 | _c20121001 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a1361-6528 | ||
| 024 | 7 |
_a10.1088/0957-4484/23/24/245201 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aPark, Hongsik | |
| 245 | 0 | 0 |
_aEvaluation of metal-nanowire electrical contacts by measuring contact end resistance. _h[electronic resource] |
| 260 |
_bNanotechnology _cJun 2012 |
||
| 300 |
_a245201 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. | ||
| 700 | 1 | _aBeresford, Roderic | |
| 700 | 1 | _aHa, Ryong | |
| 700 | 1 | _aChoi, Heon-Jin | |
| 700 | 1 | _aShin, Hyunjung | |
| 700 | 1 | _aXu, Jimmy | |
| 773 | 0 |
_tNanotechnology _gvol. 23 _gno. 24 _gp. 245201 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1088/0957-4484/23/24/245201 _zAvailable from publisher's website |
| 999 |
_c21817253 _d21817253 |
||