| 000 | 00732 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250516081850.0 | ||
| 264 | 0 | _c20121002 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a0895-3996 | ||
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aHeck, J M | |
| 245 | 0 | 0 |
_aResolution determination in X-ray microscopy: an analysis of the effects of partial coherence and illumination spectrum. _h[electronic resource] |
| 260 |
_bJournal of X-ray science and technology _cJan 1998 |
||
| 300 |
_a95-104 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aAttwood, D T | |
| 700 | 1 | _aMeyer-Ilse, W | |
| 700 | 1 | _aAnderson, E H | |
| 773 | 0 |
_tJournal of X-ray science and technology _gvol. 8 _gno. 2 _gp. 95-104 |
|
| 999 |
_c21594908 _d21594908 |
||