| 000 | 00884 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250516051740.0 | ||
| 264 | 0 | _c20121002 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a0957-4484 | ||
| 024 | 7 |
_a10.1088/0957-4484/19/40/405502 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aValdrè, Giovanni | |
| 245 | 0 | 0 |
_a3D finite element analysis of electrostatic deflection and shielding of commercial and FIB-modified cantilevers for electric and Kelvin force microscopy: II. Rectangular shaped cantilevers with asymmetric pyramidal tips. _h[electronic resource] |
| 260 |
_bNanotechnology _cOct 2008 |
||
| 300 |
_a405502 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aMoro, Daniele | |
| 773 | 0 |
_tNanotechnology _gvol. 19 _gno. 40 _gp. 405502 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1088/0957-4484/19/40/405502 _zAvailable from publisher's website |
| 999 |
_c21077167 _d21077167 |
||