| 000 | 00909 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250516045933.0 | ||
| 264 | 0 | _c20111205 | |
| 008 | 201112s 0 0 eng d | ||
| 022 | _a1361-6528 | ||
| 024 | 7 |
_a10.1088/0957-4484/22/33/335703 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aZatryb, G | |
| 245 | 0 | 0 |
_aCorrelation between stress and carrier nonradiative recombination for silicon nanocrystals in an oxide matrix. _h[electronic resource] |
| 260 |
_bNanotechnology _cAug 2011 |
||
| 300 |
_a335703 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 700 | 1 | _aPodhorodecki, A | |
| 700 | 1 | _aHao, X J | |
| 700 | 1 | _aMisiewicz, J | |
| 700 | 1 | _aShen, Y S | |
| 700 | 1 | _aGreen, M A | |
| 773 | 0 |
_tNanotechnology _gvol. 22 _gno. 33 _gp. 335703 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1088/0957-4484/22/33/335703 _zAvailable from publisher's website |
| 999 |
_c21025536 _d21025536 |
||