| 000 | 00779 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250516031921.0 | ||
| 264 | 0 | _c20110725 | |
| 008 | 201107s 0 0 eng d | ||
| 022 | _a1089-7623 | ||
| 024 | 7 |
_a10.1063/1.3557389 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aMatsui, Genzou | |
| 245 | 0 | 0 |
_aAnalysis of thermal diffusivity of Ti thin film by thermoreflectance and periodic heating technique. _h[electronic resource] |
| 260 |
_bThe Review of scientific instruments _cMar 2011 |
||
| 300 |
_a034905 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aKato, Hideyuki | |
| 773 | 0 |
_tThe Review of scientific instruments _gvol. 82 _gno. 3 _gp. 034905 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1063/1.3557389 _zAvailable from publisher's website |
| 999 |
_c20725193 _d20725193 |
||