000 00883 a2200253 4500
005 20250516031624.0
264 0 _c20110511
008 201105s 0 0 eng d
022 _a1533-4880
024 7 _a10.1166/jnn.2011.3259
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aLee, D K
245 0 0 _aDeformation characteristics of an organic thin film transistor.
_h[electronic resource]
260 _bJournal of nanoscience and nanotechnology
_cJan 2011
300 _a239-42 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't
700 1 _aLee, S C
700 1 _aSeol, Y G
700 1 _aAhn, J H
700 1 _aLee, N E
700 1 _aKim, Y J
773 0 _tJournal of nanoscience and nanotechnology
_gvol. 11
_gno. 1
_gp. 239-42
856 4 0 _uhttps://doi.org/10.1166/jnn.2011.3259
_zAvailable from publisher's website
999 _c20715539
_d20715539