000 01248 a2200313 4500
005 20250516025756.0
264 0 _c20110801
008 201108s 0 0 eng d
022 _a1361-648X
024 7 _a10.1088/0953-8984/22/26/263001
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aLauritsen, J V
245 0 0 _aAtomic resolution non-contact atomic force microscopy of clean metal oxide surfaces.
_h[electronic resource]
260 _bJournal of physics. Condensed matter : an Institute of Physics journal
_cJul 2010
300 _a263001 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Review
650 0 4 _aAluminum Oxide
_xchemistry
650 0 4 _aCerium
_xchemistry
650 0 4 _aEquipment Design
650 0 4 _aMetals
_xchemistry
650 0 4 _aMicroscopy, Atomic Force
_xinstrumentation
650 0 4 _aNanotechnology
_xmethods
650 0 4 _aSurface Properties
650 0 4 _aTitanium
_xchemistry
650 0 4 _aZinc Oxide
_xchemistry
700 1 _aReichling, M
773 0 _tJournal of physics. Condensed matter : an Institute of Physics journal
_gvol. 22
_gno. 26
_gp. 263001
856 4 0 _uhttps://doi.org/10.1088/0953-8984/22/26/263001
_zAvailable from publisher's website
999 _c20658882
_d20658882