| 000 | 00852 a2200241 4500 | ||
|---|---|---|---|
| 005 | 20250516023419.0 | ||
| 264 | 0 | _c20121002 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a0895-3996 | ||
| 024 | 7 |
_a10.3233/XST-1996-6401 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aEgarievwe, S U | |
| 245 | 0 | 0 |
_aDetection and Electrical Properties of Cd1-xZnxTe Detectors at Elevated Temperatures. _h[electronic resource] |
| 260 |
_bJournal of X-ray science and technology _cJan 1996 |
||
| 300 |
_a309-15 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aChen, K T | |
| 700 | 1 | _aBurger, A | |
| 700 | 1 | _aJames, R B | |
| 700 | 1 | _aLisse, C M | |
| 773 | 0 |
_tJournal of X-ray science and technology _gvol. 6 _gno. 4 _gp. 309-15 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.3233/XST-1996-6401 _zAvailable from publisher's website |
| 999 |
_c20585329 _d20585329 |
||