000 01089 a2200337 4500
005 20250516020611.0
264 0 _c20110418
008 201104s 0 0 eng d
022 _a1361-6528
024 7 _a10.1088/0957-4484/22/6/062001
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aLeach, Richard K
245 0 0 _aThe European nanometrology landscape.
_h[electronic resource]
260 _bNanotechnology
_cFeb 2011
300 _a062001 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't
700 1 _aBoyd, Robert
700 1 _aBurke, Theresa
700 1 _aDanzebrink, Hans-Ulrich
700 1 _aDirscherl, Kai
700 1 _aDziomba, Thorsten
700 1 _aGee, Mark
700 1 _aKoenders, Ludger
700 1 _aMorazzani, Valérie
700 1 _aPidduck, Allan
700 1 _aRoy, Debdulal
700 1 _aUnger, Wolfgang E S
700 1 _aYacoot, Andrew
773 0 _tNanotechnology
_gvol. 22
_gno. 6
_gp. 062001
856 4 0 _uhttps://doi.org/10.1088/0957-4484/22/6/062001
_zAvailable from publisher's website
999 _c20497630
_d20497630