| 000 | 01165 a2200349 4500 | ||
|---|---|---|---|
| 005 | 20250516020131.0 | ||
| 264 | 0 | _c20110414 | |
| 008 | 201104s 0 0 eng d | ||
| 022 | _a1094-4087 | ||
| 024 | 7 |
_a10.1364/OE.18.027136 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aKim, C S | |
| 245 | 0 | 0 |
_aEstimation of relative defect densities in InGaN laser diodes by induced absorption of photoexcited carriers. _h[electronic resource] |
| 260 |
_bOptics express _cDec 2010 |
||
| 300 |
_a27136-41 p. _bdigital |
||
| 500 | _aPublication Type: Evaluation Study; Journal Article; Research Support, Non-U.S. Gov't | ||
| 650 | 0 | 4 |
_aEquipment Failure Analysis _xmethods |
| 650 | 0 | 4 |
_aGallium _xchemistry |
| 650 | 0 | 4 |
_aIndium _xchemistry |
| 650 | 0 | 4 | _aLasers, Semiconductor |
| 650 | 0 | 4 |
_aPhotometry _xmethods |
| 650 | 0 | 4 | _aProtons |
| 700 | 1 | _aJang, Y D | |
| 700 | 1 | _aShin, D M | |
| 700 | 1 | _aKim, J H | |
| 700 | 1 | _aLee, D | |
| 700 | 1 | _aChoi, Y H | |
| 700 | 1 | _aNoh, M S | |
| 700 | 1 | _aYee, K J | |
| 773 | 0 |
_tOptics express _gvol. 18 _gno. 26 _gp. 27136-41 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1364/OE.18.027136 _zAvailable from publisher's website |
| 999 |
_c20483327 _d20483327 |
||