000 01042 a2200277 4500
005 20250516013935.0
264 0 _c20110425
008 201104s 0 0 eng d
022 _a1530-6992
024 7 _a10.1021/nl103603v
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aHong, Seung Sae
245 0 0 _aOne nanometer resolution electrical probe via atomic metal filament formation.
_h[electronic resource]
260 _bNano letters
_cJan 2011
300 _a231-5 p.
_bdigital
500 _aPublication Type: Evaluation Study; Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.
650 0 4 _aEquipment Design
650 0 4 _aMetals
_xchemistry
650 0 4 _aMicroscopy, Atomic Force
_xinstrumentation
650 0 4 _aNanotubes, Carbon
_xultrastructure
650 0 4 _aSensitivity and Specificity
700 1 _aCha, Judy J
700 1 _aCui, Yi
773 0 _tNano letters
_gvol. 11
_gno. 1
_gp. 231-5
856 4 0 _uhttps://doi.org/10.1021/nl103603v
_zAvailable from publisher's website
999 _c20413612
_d20413612