000 | 01042 a2200277 4500 | ||
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005 | 20250516013935.0 | ||
264 | 0 | _c20110425 | |
008 | 201104s 0 0 eng d | ||
022 | _a1530-6992 | ||
024 | 7 |
_a10.1021/nl103603v _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aHong, Seung Sae | |
245 | 0 | 0 |
_aOne nanometer resolution electrical probe via atomic metal filament formation. _h[electronic resource] |
260 |
_bNano letters _cJan 2011 |
||
300 |
_a231-5 p. _bdigital |
||
500 | _aPublication Type: Evaluation Study; Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. | ||
650 | 0 | 4 | _aEquipment Design |
650 | 0 | 4 |
_aMetals _xchemistry |
650 | 0 | 4 |
_aMicroscopy, Atomic Force _xinstrumentation |
650 | 0 | 4 |
_aNanotubes, Carbon _xultrastructure |
650 | 0 | 4 | _aSensitivity and Specificity |
700 | 1 | _aCha, Judy J | |
700 | 1 | _aCui, Yi | |
773 | 0 |
_tNano letters _gvol. 11 _gno. 1 _gp. 231-5 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1021/nl103603v _zAvailable from publisher's website |
999 |
_c20413612 _d20413612 |