| 000 | 00794 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250516011341.0 | ||
| 264 | 0 | _c20110211 | |
| 008 | 201102s 0 0 eng d | ||
| 022 | _a1089-7623 | ||
| 024 | 7 |
_a10.1063/1.3464475 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aHappel, T | |
| 245 | 0 | 0 |
_aOn the role of spectral resolution in velocity shear layer measurements by Doppler reflectometry. _h[electronic resource] |
| 260 |
_bThe Review of scientific instruments _cOct 2010 |
||
| 300 |
_a10D901 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aBlanco, E | |
| 700 | 1 | _aEstrada, T | |
| 773 | 0 |
_tThe Review of scientific instruments _gvol. 81 _gno. 10 _gp. 10D901 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1063/1.3464475 _zAvailable from publisher's website |
| 999 |
_c20333813 _d20333813 |
||