000 00736 a2200205 4500
005 20250516004546.0
264 0 _c20121002
008 201210s 0 0 eng d
022 _a1559-128X
024 7 _a10.1364/AO.33.005426
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aFriberg, A T
245 0 0 _aReconstruction of optical-source profiles from fixed-baseline two-pinhole spectral measurements.
_h[electronic resource]
260 _bApplied optics
_cAug 1994
300 _a5426-31 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aFischer, D G
773 0 _tApplied optics
_gvol. 33
_gno. 23
_gp. 5426-31
856 4 0 _uhttps://doi.org/10.1364/AO.33.005426
_zAvailable from publisher's website
999 _c20239962
_d20239962