000 00928 a2200289 4500
005 20250516002902.0
264 0 _c20130704
008 201307s 0 0 eng d
022 _a1559-128X
024 7 _a10.1364/AO.32.007022
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aAttwood, D
245 0 0 _aUndulator radiation for at-wavelength interferometry of optics for extreme-ultraviolet lithography.
_h[electronic resource]
260 _bApplied optics
_cDec 1993
300 _a7022-31 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aSommargren, G
700 1 _aBeguiristain, R
700 1 _aNguyen, K
700 1 _aBokor, J
700 1 _aCeglio, N
700 1 _aJackson, K
700 1 _aKoike, M
700 1 _aUnderwood, J
773 0 _tApplied optics
_gvol. 32
_gno. 34
_gp. 7022-31
856 4 0 _uhttps://doi.org/10.1364/AO.32.007022
_zAvailable from publisher's website
999 _c20186706
_d20186706