000 01069 a2200229 4500
005 20250516002703.0
264 0 _c20110104
008 201101s 0 0 eng d
022 _a1435-8115
024 7 _a10.1017/S1431927610000449
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aPhilippe, Thomas
245 0 0 _aClustering and local magnification effects in atom probe tomography: a statistical approach.
_h[electronic resource]
260 _bMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
_cOct 2010
300 _a643-8 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aGruber, Maria
700 1 _aVurpillot, François
700 1 _aBlavette, D
773 0 _tMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
_gvol. 16
_gno. 5
_gp. 643-8
856 4 0 _uhttps://doi.org/10.1017/S1431927610000449
_zAvailable from publisher's website
999 _c20180099
_d20180099