| 000 | 00789 a2200229 4500 | ||
|---|---|---|---|
| 005 | 20250516002128.0 | ||
| 264 | 0 | _c20121002 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a1559-128X | ||
| 024 | 7 |
_a10.1364/AO.32.003448 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aRönnow, D | |
| 245 | 0 | 0 |
_aDetermination of interface roughness by using a spectroscopic total-integrated-scatter instrument. _h[electronic resource] |
| 260 |
_bApplied optics _cJul 1993 |
||
| 300 |
_a3448-51 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aBergkvist, M | |
| 700 | 1 | _aRoos, A | |
| 700 | 1 | _aRibbing, C G | |
| 773 | 0 |
_tApplied optics _gvol. 32 _gno. 19 _gp. 3448-51 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1364/AO.32.003448 _zAvailable from publisher's website |
| 999 |
_c20162079 _d20162079 |
||