| 000 | 00851 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250515235158.0 | ||
| 264 | 0 | _c20121002 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a1559-128X | ||
| 024 | 7 |
_a10.1364/AO.31.004519 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aGülker, G | |
| 245 | 0 | 0 |
_aTwo-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields. _h[electronic resource] |
| 260 |
_bApplied optics _cAug 1992 |
||
| 300 |
_a4519-21 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aHaack, O | |
| 700 | 1 | _aHinsch, K D | |
| 700 | 1 | _aHölscher, C | |
| 700 | 1 | _aKuls, J | |
| 700 | 1 | _aPlaten, W | |
| 773 | 0 |
_tApplied optics _gvol. 31 _gno. 22 _gp. 4519-21 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1364/AO.31.004519 _zAvailable from publisher's website |
| 999 |
_c20061046 _d20061046 |
||