000 | 01069 a2200361 4500 | ||
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005 | 20250515234216.0 | ||
264 | 0 | _c20101217 | |
008 | 201012s 0 0 eng d | ||
022 | _a1879-2723 | ||
024 | 7 |
_a10.1016/j.ultramic.2010.07.007 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aSchmidt, Th | |
245 | 0 | 0 |
_aDouble aberration correction in a low-energy electron microscope. _h[electronic resource] |
260 |
_bUltramicroscopy _cOct 2010 |
||
300 |
_a1358-61 p. _bdigital |
||
500 | _aPublication Type: Journal Article | ||
700 | 1 | _aMarchetto, H | |
700 | 1 | _aLévesque, P L | |
700 | 1 | _aGroh, U | |
700 | 1 | _aMaier, F | |
700 | 1 | _aPreikszas, D | |
700 | 1 | _aHartel, P | |
700 | 1 | _aSpehr, R | |
700 | 1 | _aLilienkamp, G | |
700 | 1 | _aEngel, W | |
700 | 1 | _aFink, R | |
700 | 1 | _aBauer, E | |
700 | 1 | _aRose, H | |
700 | 1 | _aUmbach, E | |
700 | 1 | _aFreund, H-J | |
773 | 0 |
_tUltramicroscopy _gvol. 110 _gno. 11 _gp. 1358-61 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.ultramic.2010.07.007 _zAvailable from publisher's website |
999 |
_c20030576 _d20030576 |