000 | 01230 a2200361 4500 | ||
---|---|---|---|
005 | 20250515234101.0 | ||
264 | 0 | _c20101122 | |
008 | 201011s 0 0 eng d | ||
022 | _a1089-7623 | ||
024 | 7 |
_a10.1063/1.3456986 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aWagner, J | |
245 | 0 | 0 |
_aQuality analysis of selective microparticle deposition on electrically programmable surfaces. _h[electronic resource] |
260 |
_bThe Review of scientific instruments _cJul 2010 |
||
300 |
_a073703 p. _bdigital |
||
500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
650 | 0 | 4 | _aElectricity |
650 | 0 | 4 |
_aImage Processing, Computer-Assisted _xmethods |
650 | 0 | 4 | _aProtein Array Analysis |
650 | 0 | 4 | _aQuality Control |
650 | 0 | 4 | _aSurface Properties |
700 | 1 | _aLöffler, F | |
700 | 1 | _aKönig, K | |
700 | 1 | _aFernandez, S | |
700 | 1 | _aNesterov-Müller, A | |
700 | 1 | _aBreitling, F | |
700 | 1 | _aBischoff, F R | |
700 | 1 | _aStadler, V | |
700 | 1 | _aHausmann, M | |
700 | 1 | _aLindenstruth, V | |
773 | 0 |
_tThe Review of scientific instruments _gvol. 81 _gno. 7 _gp. 073703 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1063/1.3456986 _zAvailable from publisher's website |
999 |
_c20026344 _d20026344 |