000 00812 a2200241 4500
005 20250515211059.0
264 0 _c20121211
008 201212s 0 0 eng d
022 _a1559-128X
024 7 _a10.1364/AO.17.001739
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aFonck, R J
245 0 0 _aAll-reflection Michelson interferometer: analysis and test for far ir Fourier spectroscopy.
_h[electronic resource]
260 _bApplied optics
_cJun 1978
300 _a1739-47 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aHuppler, D A
700 1 _aRoesler, F L
700 1 _aTracy, D H
700 1 _aDaehler, M
773 0 _tApplied optics
_gvol. 17
_gno. 11
_gp. 1739-47
856 4 0 _uhttps://doi.org/10.1364/AO.17.001739
_zAvailable from publisher's website
999 _c19565817
_d19565817