| 000 | 00836 a2200229 4500 | ||
|---|---|---|---|
| 005 | 20250515182327.0 | ||
| 264 | 0 | _c20091009 | |
| 008 | 200910s 0 0 eng d | ||
| 022 | _a1089-7623 | ||
| 024 | 7 |
_a10.1063/1.3159863 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aWang, Jianli | |
| 245 | 0 | 0 |
_aMeasurements of thermal effusivity of a fine wire and contact resistance of a junction using a T type probe. _h[electronic resource] |
| 260 |
_bThe Review of scientific instruments _cJul 2009 |
||
| 300 |
_a076107 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aGu, Ming | |
| 700 | 1 | _aZhang, Xing | |
| 700 | 1 | _aWu, Gangping | |
| 773 | 0 |
_tThe Review of scientific instruments _gvol. 80 _gno. 7 _gp. 076107 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1063/1.3159863 _zAvailable from publisher's website |
| 999 |
_c19062909 _d19062909 |
||