| 000 | 00768 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250515182058.0 | ||
| 264 | 0 | _c20091201 | |
| 008 | 200912s 0 0 eng d | ||
| 022 | _a1879-2723 | ||
| 024 | 7 |
_a10.1016/j.ultramic.2009.07.003 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aBrunner, Matthias J | |
| 245 | 0 | 0 |
_aAutomated monitoring to reduce electron microscope downtime. _h[electronic resource] |
| 260 |
_bUltramicroscopy _cOct 2009 |
||
| 300 |
_a1389-92 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 700 | 1 | _aResch, Guenter P | |
| 773 | 0 |
_tUltramicroscopy _gvol. 109 _gno. 11 _gp. 1389-92 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.ultramic.2009.07.003 _zAvailable from publisher's website |
| 999 |
_c19055218 _d19055218 |
||