000 01178 a2200253 4500
005 20250515172234.0
264 0 _c20090701
008 200907s 0 0 eng d
022 _a1435-8115
024 7 _a10.1017/S1431927609090278
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aSourty, Erwan
245 0 0 _aHigh-angle annular dark field scanning transmission electron microscopy on carbon-based functional polymer systems.
_h[electronic resource]
260 _bMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
_cJun 2009
300 _a251-8 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't
700 1 _avan Bavel, Svetlana
700 1 _aLu, Kangbo
700 1 _aGuerra, Ralph
700 1 _aBar, Georg
700 1 _aLoos, Joachim
773 0 _tMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
_gvol. 15
_gno. 3
_gp. 251-8
856 4 0 _uhttps://doi.org/10.1017/S1431927609090278
_zAvailable from publisher's website
999 _c18886387
_d18886387