| 000 | 01383 a2200397 4500 | ||
|---|---|---|---|
| 005 | 20250515170914.0 | ||
| 264 | 0 | _c20090701 | |
| 008 | 200907s 0 0 eng d | ||
| 022 | _a1361-6528 | ||
| 024 | 7 |
_a10.1088/0957-4484/20/10/105203 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aChiu, Shao-Pin | |
| 245 | 0 | 0 |
_aFour-probe electrical-transport measurements on single indium tin oxide nanowires between 1.5 and 300 K. _h[electronic resource] |
| 260 |
_bNanotechnology _cMar 2009 |
||
| 300 |
_a105203 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 650 | 0 | 4 |
_aCrystallization _xmethods |
| 650 | 0 | 4 | _aElectric Impedance |
| 650 | 0 | 4 | _aElectron Transport |
| 650 | 0 | 4 |
_aMacromolecular Substances _xchemistry |
| 650 | 0 | 4 |
_aMaterials Testing _xmethods |
| 650 | 0 | 4 | _aMolecular Conformation |
| 650 | 0 | 4 |
_aNanostructures _xchemistry |
| 650 | 0 | 4 |
_aNanotechnology _xmethods |
| 650 | 0 | 4 | _aParticle Size |
| 650 | 0 | 4 | _aSurface Properties |
| 650 | 0 | 4 | _aTemperature |
| 650 | 0 | 4 |
_aTin Compounds _xchemistry |
| 700 | 1 | _aChung, Hui-Fang | |
| 700 | 1 | _aLin, Yong-Han | |
| 700 | 1 | _aKai, Ji-Jung | |
| 700 | 1 | _aChen, Fu-Rong | |
| 700 | 1 | _aLin, Juhn-Jong | |
| 773 | 0 |
_tNanotechnology _gvol. 20 _gno. 10 _gp. 105203 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1088/0957-4484/20/10/105203 _zAvailable from publisher's website |
| 999 |
_c18846309 _d18846309 |
||