000 01307 a2200397 4500
005 20250515160213.0
264 0 _c20090320
008 200903s 0 0 eng d
022 _a1936-086X
024 7 _a10.1021/nn800053x
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aZareie, Hadi M
245 0 0 _aNanocapacitive circuit elements.
_h[electronic resource]
260 _bACS nano
_cAug 2008
300 _a1615-9 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't
650 0 4 _aCrystallization
_xmethods
650 0 4 _aElectric Capacitance
650 0 4 _aElectronics
_xinstrumentation
650 0 4 _aEquipment Design
650 0 4 _aEquipment Failure Analysis
650 0 4 _aMacromolecular Substances
_xchemistry
650 0 4 _aMaterials Testing
650 0 4 _aMolecular Conformation
650 0 4 _aNanostructures
_xchemistry
650 0 4 _aNanotechnology
_xinstrumentation
650 0 4 _aParticle Size
650 0 4 _aSurface Properties
700 1 _aMorgan, Scott W
700 1 _aMoghaddam, Matthew
700 1 _aMaaroof, Abbas I
700 1 _aCortie, Michael B
700 1 _aPhillips, Matthew R
773 0 _tACS nano
_gvol. 2
_gno. 8
_gp. 1615-9
856 4 0 _uhttps://doi.org/10.1021/nn800053x
_zAvailable from publisher's website
999 _c18650291
_d18650291