000 01015 a2200277 4500
005 20250515154623.0
264 0 _c20090325
008 200903s 0 0 eng d
022 _a1097-0029
024 7 _a10.1002/jemt.20679
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aCaillard, Daniel
245 0 0 _aThe Hall-Petch law investigated by means of in situ straining experiments in lamellar TiAl and deformed Al.
_h[electronic resource]
260 _bMicroscopy research and technique
_cMar 2009
300 _a261-9 p.
_bdigital
500 _aPublication Type: Journal Article
650 0 4 _aAlloys
_xchemistry
650 0 4 _aAluminum
_xchemistry
650 0 4 _aMicroscopy, Electron, Transmission
650 0 4 _aNanostructures
_xchemistry
650 0 4 _aSurface Properties
650 0 4 _aTitanium
_xchemistry
700 1 _aCouret, Alain
773 0 _tMicroscopy research and technique
_gvol. 72
_gno. 3
_gp. 261-9
856 4 0 _uhttps://doi.org/10.1002/jemt.20679
_zAvailable from publisher's website
999 _c18603775
_d18603775