000 01422 a2200445 4500
005 20250515151013.0
264 0 _c20090212
008 200902s 0 0 eng d
022 _a1089-7623
024 7 _a10.1063/1.2968118
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aVerbeni, Roberto
245 0 0 _aEnergy calibration of a high-resolution inelastic x-ray scattering spectrometer.
_h[electronic resource]
260 _bThe Review of scientific instruments
_cAug 2008
300 _a083902 p.
_bdigital
500 _aPublication Type: Journal Article
650 0 4 _aCalibration
650 0 4 _aCrystallization
650 0 4 _aDiamond
_xchemistry
650 0 4 _aEquipment Design
650 0 4 _aInterferometry
650 0 4 _aNitrogen
_xchemistry
650 0 4 _aOptics and Photonics
650 0 4 _aPhysical Phenomena
650 0 4 _aScattering, Radiation
650 0 4 _aSilicon
_xchemistry
650 0 4 _aSpectrophotometry
_xinstrumentation
650 0 4 _aTemperature
650 0 4 _aVibration
650 0 4 _aX-Rays
700 1 _aD'Astuto, Matteo
700 1 _aKrisch, Michael
700 1 _aLorenzen, Maren
700 1 _aMermet, Alain
700 1 _aMonaco, Giulio
700 1 _aRequardt, Herwig
700 1 _aSette, Francesco
773 0 _tThe Review of scientific instruments
_gvol. 79
_gno. 8
_gp. 083902
856 4 0 _uhttps://doi.org/10.1063/1.2968118
_zAvailable from publisher's website
999 _c18499387
_d18499387