| 000 | 00743 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250515144516.0 | ||
| 264 | 0 | _c20121002 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a0039-9140 | ||
| 024 | 7 |
_a10.1016/0039-9140(85)80056-4 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aSoma, M | |
| 245 | 0 | 0 |
_aCharacterization of sediment reference materials by x-ray photoelectron spectroscopy. _h[electronic resource] |
| 260 |
_bTalanta _cMar 1985 |
||
| 300 |
_a177-81 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aSeyama, H | |
| 700 | 1 | _aOkamoto, K | |
| 773 | 0 |
_tTalanta _gvol. 32 _gno. 3 _gp. 177-81 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/0039-9140(85)80056-4 _zAvailable from publisher's website |
| 999 |
_c18425901 _d18425901 |
||