| 000 | 01067 a2200277 4500 | ||
|---|---|---|---|
| 005 | 20250515124725.0 | ||
| 264 | 0 | _c20080813 | |
| 008 | 200808s 0 0 eng d | ||
| 022 | _a1873-3573 | ||
| 024 | 7 |
_a10.1016/j.talanta.2008.04.001 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aTakeuchi, Masaki | |
| 245 | 0 | 0 |
_aUse of a capacitance measurement device for surrogate noncontact conductance measurement. _h[electronic resource] |
| 260 |
_bTalanta _cJul 2008 |
||
| 300 |
_a617-20 p. _bdigital |
||
| 500 | _aPublication Type: Evaluation Study; Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S. | ||
| 650 | 0 | 4 |
_aChromatography, Ion Exchange _xinstrumentation |
| 650 | 0 | 4 | _aElectric Capacitance |
| 650 | 0 | 4 | _aElectric Conductivity |
| 700 | 1 | _aLi, Qingyang | |
| 700 | 1 | _aYang, Bingcheng | |
| 700 | 1 | _aDasgupta, Purnendu K | |
| 700 | 1 | _aWilde, Vincent E | |
| 773 | 0 |
_tTalanta _gvol. 76 _gno. 3 _gp. 617-20 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.talanta.2008.04.001 _zAvailable from publisher's website |
| 999 |
_c18068661 _d18068661 |
||