| 000 | 00937 a2200253 4500 | ||
|---|---|---|---|
| 005 | 20250515124310.0 | ||
| 264 | 0 | _c20081204 | |
| 008 | 200812s 0 0 eng d | ||
| 022 | _a0304-3991 | ||
| 024 | 7 |
_a10.1016/j.ultramic.2008.04.067 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aLee, Joon Sung | |
| 245 | 0 | 0 |
_aLocal inhomogeneity in gate hysteresis of carbon nanotube field-effect transistors investigated by scanning gate microscopy. _h[electronic resource] |
| 260 |
_bUltramicroscopy _cSep 2008 |
||
| 300 |
_a1045-9 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't | ||
| 700 | 1 | _aRyu, Sunmin | |
| 700 | 1 | _aYoo, Kwonjae | |
| 700 | 1 | _aKim, Jinhee | |
| 700 | 1 | _aChoi, Insung S | |
| 700 | 1 | _aYun, Wan Soo | |
| 773 | 0 |
_tUltramicroscopy _gvol. 108 _gno. 10 _gp. 1045-9 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.ultramic.2008.04.067 _zAvailable from publisher's website |
| 999 |
_c18057676 _d18057676 |
||