| 000 | 00907 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250515123733.0 | ||
| 264 | 0 | _c20090106 | |
| 008 | 200901s 0 0 eng d | ||
| 022 | _a0968-4328 | ||
| 024 | 7 |
_a10.1016/j.micron.2008.02.006 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aLangford, R M | |
| 245 | 0 | 0 |
_aIn situ lift-out: steps to improve yield and a comparison with other FIB TEM sample preparation techniques. _h[electronic resource] |
| 260 |
_bMicron (Oxford, England : 1993) _cDec 2008 |
||
| 300 |
_a1325-30 p. _bdigital |
||
| 500 | _aPublication Type: Comparative Study; Journal Article; Research Support, Non-U.S. Gov't | ||
| 650 | 0 | 4 |
_aMicroscopy, Electron, Transmission _xmethods |
| 700 | 1 | _aRogers, M | |
| 773 | 0 |
_tMicron (Oxford, England : 1993) _gvol. 39 _gno. 8 _gp. 1325-30 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.micron.2008.02.006 _zAvailable from publisher's website |
| 999 |
_c18040756 _d18040756 |
||