000 01131 a2200289 4500
005 20250515122718.0
264 0 _c20080708
008 200807s 0 0 eng d
022 _a0885-3010
024 7 _a10.1109/TUFFC.2008.758
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aKim, E S
245 0 0 _aMicrowave dielectric properties of (A2+(1/3)B5+(2/3))0.5Ti0(0.5)O2 (A2+ = Zn, Mg, B5+ = Nb, Ta) ceramics.
_h[electronic resource]
260 _bIEEE transactions on ultrasonics, ferroelectrics, and frequency control
_cMay 2008
300 _a1069-74 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't
650 0 4 _aCeramics
_xchemistry
650 0 4 _aComputer Simulation
650 0 4 _aCrystallization
_xmethods
650 0 4 _aElectric Impedance
650 0 4 _aMaterials Testing
650 0 4 _aMicrowaves
650 0 4 _aModels, Chemical
700 1 _aKang, D H
773 0 _tIEEE transactions on ultrasonics, ferroelectrics, and frequency control
_gvol. 55
_gno. 5
_gp. 1069-74
856 4 0 _uhttps://doi.org/10.1109/TUFFC.2008.758
_zAvailable from publisher's website
999 _c18012114
_d18012114