| 000 | 00776 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250515105859.0 | ||
| 264 | 0 | _c20121002 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a1559-128X | ||
| 024 | 7 |
_a10.1364/ao.36.002936 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aChiu, M H | |
| 245 | 0 | 0 |
_aRefractive-index measurement based on the effects of total internal reflection and the uses of heterodyne interferometry. _h[electronic resource] |
| 260 |
_bApplied optics _cMay 1997 |
||
| 300 |
_a2936-9 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aLee, J Y | |
| 700 | 1 | _aSu, D C | |
| 773 | 0 |
_tApplied optics _gvol. 36 _gno. 13 _gp. 2936-9 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1364/ao.36.002936 _zAvailable from publisher's website |
| 999 |
_c17758988 _d17758988 |
||