| 000 | 00772 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250515105857.0 | ||
| 264 | 0 | _c20121002 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a1559-128X | ||
| 024 | 7 |
_a10.1364/ao.36.002178 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aKawabata, S | |
| 245 | 0 | 0 |
_aCalibration method of the specific characteristic of an electronic system of a rotating-analyzer ellipsometer. _h[electronic resource] |
| 260 |
_bApplied optics _cApr 1997 |
||
| 300 |
_a2178-82 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aMotoki, M | |
| 700 | 1 | _aYokota, H | |
| 773 | 0 |
_tApplied optics _gvol. 36 _gno. 10 _gp. 2178-82 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1364/ao.36.002178 _zAvailable from publisher's website |
| 999 |
_c17758882 _d17758882 |
||