| 000 | 00701 a2200205 4500 | ||
|---|---|---|---|
| 005 | 20250515104217.0 | ||
| 264 | 0 | _c20121002 | |
| 008 | 201210s 0 0 eng d | ||
| 022 | _a1559-128X | ||
| 024 | 7 |
_a10.1364/ao.22.003177 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aDing, T N | |
| 245 | 0 | 0 |
_aMeasuring refractive index and thickness of thin films: a new technique. _h[electronic resource] |
| 260 |
_bApplied optics _cOct 1983 |
||
| 300 |
_a3177 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aGarmire, E | |
| 773 | 0 |
_tApplied optics _gvol. 22 _gno. 20 _gp. 3177 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1364/ao.22.003177 _zAvailable from publisher's website |
| 999 |
_c17708260 _d17708260 |
||