000 00707 a2200229 4500
005 20250515101126.0
264 0 _c20080121
008 200801s 0 0 fre d
022 _a0014-4754
024 7 _a10.1007/BF02145009
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aKELLENBERGER, E
245 0 0 _aElectronic microscopy.
_h[electronic resource]
260 _bExperientia
_cNov 1948
300 _a449 p.
_bdigital
500 _aPublication Type: Journal Article
650 0 4 _aElectrons
650 0 4 _aMicroscopy
650 0 4 _aMicroscopy, Electron
773 0 _tExperientia
_gvol. 4
_gno. 11
_gp. 449
856 4 0 _uhttps://doi.org/10.1007/BF02145009
_zAvailable from publisher's website
999 _c17614766
_d17614766