000 01158 a2200253 4500
005 20250515065742.0
264 0 _c20070806
008 200708s 0 0 eng d
022 _a1431-9276
024 7 _a10.1017/S1431927607070316
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aDenecke, Melissa A
245 0 0 _aMicroanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation.
_h[electronic resource]
260 _bMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
_cJun 2007
300 _a165-72 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aSomogyi, Andrea
700 1 _aJanssens, Koen
700 1 _aSimon, Rolf
700 1 _aDardenne, Kathy
700 1 _aNoseck, Ulrich
773 0 _tMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
_gvol. 13
_gno. 3
_gp. 165-72
856 4 0 _uhttps://doi.org/10.1017/S1431927607070316
_zAvailable from publisher's website
999 _c17036044
_d17036044