000 | 01158 a2200253 4500 | ||
---|---|---|---|
005 | 20250515065742.0 | ||
264 | 0 | _c20070806 | |
008 | 200708s 0 0 eng d | ||
022 | _a1431-9276 | ||
024 | 7 |
_a10.1017/S1431927607070316 _2doi |
|
040 |
_aNLM _beng _cNLM |
||
100 | 1 | _aDenecke, Melissa A | |
245 | 0 | 0 |
_aMicroanalysis (micro-XRF, micro-XANES, and micro-XRD) of a tertiary sediment using microfocused synchrotron radiation. _h[electronic resource] |
260 |
_bMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada _cJun 2007 |
||
300 |
_a165-72 p. _bdigital |
||
500 | _aPublication Type: Journal Article | ||
700 | 1 | _aSomogyi, Andrea | |
700 | 1 | _aJanssens, Koen | |
700 | 1 | _aSimon, Rolf | |
700 | 1 | _aDardenne, Kathy | |
700 | 1 | _aNoseck, Ulrich | |
773 | 0 |
_tMicroscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada _gvol. 13 _gno. 3 _gp. 165-72 |
|
856 | 4 | 0 |
_uhttps://doi.org/10.1017/S1431927607070316 _zAvailable from publisher's website |
999 |
_c17036044 _d17036044 |