000 01099 a2200301 4500
005 20250515063940.0
264 0 _c20070516
008 200705s 0 0 eng d
022 _a0899-8205
024 7 _a10.2345/0899-8205(2007)41[147:LCANCF]2.0.CO;2
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aBackes, John
245 0 0 _aLower currents: a new choice for routine testing.
_h[electronic resource]
260 _bBiomedical instrumentation & technology
_c
300 _a147-50 p.
_bdigital
500 _aPublication Type: Journal Article; Review
650 0 4 _aElectric Conductivity
650 0 4 _aElectric Injuries
_xprevention & control
650 0 4 _aElectricity
650 0 4 _aElectronics, Medical
650 0 4 _aEquipment Failure Analysis
_xinstrumentation
650 0 4 _aEquipment Safety
650 0 4 _aHumans
650 0 4 _aMaintenance
_xmethods
650 0 4 _aUnited States
773 0 _tBiomedical instrumentation & technology
_gvol. 41
_gno. 2
_gp. 147-50
856 4 0 _uhttps://doi.org/10.2345/0899-8205(2007)41[147:LCANCF]2.0.CO;2
_zAvailable from publisher's website
999 _c16983308
_d16983308