000 01553 a2200433 4500
005 20250515052159.0
264 0 _c20070130
008 200701s 0 0 eng d
022 _a0885-3010
024 7 _a10.1109/tuffc.2006.187
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aTobar, Michael E
245 0 0 _aLong-term operation and performance of cryogenic sapphire oscillators.
_h[electronic resource]
260 _bIEEE transactions on ultrasonics, ferroelectrics, and frequency control
_cDec 2006
300 _a2386-93 p.
_bdigital
500 _aPublication Type: Evaluation Study; Journal Article; Research Support, Non-U.S. Gov't
650 0 4 _aAluminum Oxide
650 0 4 _aCold Temperature
650 0 4 _aElectrochemistry
_xinstrumentation
650 0 4 _aElectronics
_xinstrumentation
650 0 4 _aEquipment Design
650 0 4 _aEquipment Failure Analysis
700 1 _aIvanov, Eugene N
700 1 _aLocke, Clayton R
700 1 _aStanwix, Paul L
700 1 _aHartnett, John G
700 1 _aLuiten, Andre N
700 1 _aWarrington, Richard B
700 1 _aFisk, Peter T H
700 1 _aLawn, Malcolm A
700 1 _aWouters, Michael J
700 1 _aBize, Sebastien
700 1 _aSantarelli, Giorgio
700 1 _aWolf, Peter
700 1 _aClairon, Andre
700 1 _aGuillemot, Philippe
773 0 _tIEEE transactions on ultrasonics, ferroelectrics, and frequency control
_gvol. 53
_gno. 12
_gp. 2386-93
856 4 0 _uhttps://doi.org/10.1109/tuffc.2006.187
_zAvailable from publisher's website
999 _c16754332
_d16754332