000 00924 a2200265 4500
005 20250515040325.0
264 0 _c20070328
008 200703s 0 0 eng d
022 _a0968-4328
024 7 _a10.1016/j.micron.2006.06.004
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aChen, Ko-Feng
245 0 0 _aValence state map of iron oxide thin film obtained from electron spectroscopy imaging series.
_h[electronic resource]
260 _bMicron (Oxford, England : 1993)
_c2007
300 _a354-61 p.
_bdigital
500 _aPublication Type: Journal Article
700 1 _aLo, Shen-Chuan
700 1 _aChang, Li
700 1 _aEgerton, Ray
700 1 _aKai, Ji-Jung
700 1 _aLin, Juhn-Jong
700 1 _aChen, Fu-Rong
773 0 _tMicron (Oxford, England : 1993)
_gvol. 38
_gno. 4
_gp. 354-61
856 4 0 _uhttps://doi.org/10.1016/j.micron.2006.06.004
_zAvailable from publisher's website
999 _c16520280
_d16520280