| 000 | 01574 a2200565 4500 | ||
|---|---|---|---|
| 005 | 20250515035504.0 | ||
| 264 | 0 | _c20061003 | |
| 008 | 200610s 0 0 eng d | ||
| 022 | _a0031-9007 | ||
| 024 | 7 |
_a10.1103/PhysRevLett.96.252501 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
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| 100 | 1 | _aRuiz, C | |
| 245 | 0 | 0 |
_aMeasurement of the Ec.m. = 184 keV resonance strength in the 26gAl (p, gamma)27 Si reaction. _h[electronic resource] |
| 260 |
_bPhysical review letters _cJun 2006 |
||
| 300 |
_a252501 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aParikh, A | |
| 700 | 1 | _aJosé, J | |
| 700 | 1 | _aBuchmann, L | |
| 700 | 1 | _aCaggiano, J A | |
| 700 | 1 | _aChen, A A | |
| 700 | 1 | _aClark, J A | |
| 700 | 1 | _aCrawford, H | |
| 700 | 1 | _aDavids, B | |
| 700 | 1 | _aD'Auria, J M | |
| 700 | 1 | _aDavis, C | |
| 700 | 1 | _aDeibel, C | |
| 700 | 1 | _aErikson, L | |
| 700 | 1 | _aFogarty, L | |
| 700 | 1 | _aFrekers, D | |
| 700 | 1 | _aGreife, U | |
| 700 | 1 | _aHussein, A | |
| 700 | 1 | _aHutcheon, D A | |
| 700 | 1 | _aHuyse, M | |
| 700 | 1 | _aJewett, C | |
| 700 | 1 | _aLaird, A M | |
| 700 | 1 | _aLewis, R | |
| 700 | 1 | _aMumby-Croft, P | |
| 700 | 1 | _aOlin, A | |
| 700 | 1 | _aOttewell, D F | |
| 700 | 1 | _aOuellet, C V | |
| 700 | 1 | _aParker, P | |
| 700 | 1 | _aPearson, J | |
| 700 | 1 | _aRuprecht, G | |
| 700 | 1 | _aTrinczek, M | |
| 700 | 1 | _aVockenhuber, C | |
| 700 | 1 | _aWrede, C | |
| 773 | 0 |
_tPhysical review letters _gvol. 96 _gno. 25 _gp. 252501 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1103/PhysRevLett.96.252501 _zAvailable from publisher's website |
| 999 |
_c16494646 _d16494646 |
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