| 000 | 00918 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250515023754.0 | ||
| 264 | 0 | _c20060615 | |
| 008 | 200606s 0 0 eng d | ||
| 022 | _a1059-910X | ||
| 024 | 7 |
_a10.1002/jemt.20293 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aCrimp, Martin A | |
| 245 | 0 | 0 |
_aScanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast. _h[electronic resource] |
| 260 |
_bMicroscopy research and technique _cMay 2006 |
||
| 300 |
_a374-81 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.; Review | ||
| 650 | 0 | 4 | _aElectrons |
| 650 | 0 | 4 |
_aMicroscopy, Electron, Scanning _xmethods |
| 773 | 0 |
_tMicroscopy research and technique _gvol. 69 _gno. 5 _gp. 374-81 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1002/jemt.20293 _zAvailable from publisher's website |
| 999 |
_c16248462 _d16248462 |
||