000 00904 a2200229 4500
005 20250515023754.0
264 0 _c20060615
008 200606s 0 0 eng d
022 _a1059-910X
024 7 _a10.1002/jemt.20291
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aMiller, Michael K
245 0 0 _aAtom probe tomography characterization of solute segregation to dislocations.
_h[electronic resource]
260 _bMicroscopy research and technique
_cMay 2006
300 _a359-65 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, U.S. Gov't, Non-P.H.S.; Review
650 0 4 _aElectron Probe Microanalysis
_xmethods
650 0 4 _aNanotechnology
_xmethods
650 0 4 _aTomography
_xmethods
773 0 _tMicroscopy research and technique
_gvol. 69
_gno. 5
_gp. 359-65
856 4 0 _uhttps://doi.org/10.1002/jemt.20291
_zAvailable from publisher's website
999 _c16248461
_d16248461