| 000 | 00819 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250515020703.0 | ||
| 264 | 0 | _c20060522 | |
| 008 | 200605s 0 0 eng d | ||
| 022 | _a1559-128X | ||
| 024 | 7 |
_a10.1364/ao.45.001344 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aLee, Cheng-Chung | |
| 245 | 0 | 0 |
_aInfluence of monitor passband width on the layer thickness determination during deposition of a dense-wavelength-division-multiplexing filter. _h[electronic resource] |
| 260 |
_bApplied optics _cMar 2006 |
||
| 300 |
_a1344-8 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aKuo, Chien-Cheng | |
| 700 | 1 | _aChen, Sheng-Hui | |
| 773 | 0 |
_tApplied optics _gvol. 45 _gno. 7 _gp. 1344-8 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1364/ao.45.001344 _zAvailable from publisher's website |
| 999 |
_c16147983 _d16147983 |
||