000 01332 a2200385 4500
005 20250515002417.0
264 0 _c20051103
008 200511s 0 0 eng d
022 _a1533-4880
024 7 _a10.1166/jnn.2005.310
_2doi
040 _aNLM
_beng
_cNLM
100 1 _aChen, Xiaobo
245 0 0 _aDoped semiconductor nanomaterials.
_h[electronic resource]
260 _bJournal of nanoscience and nanotechnology
_cSep 2005
300 _a1408-20 p.
_bdigital
500 _aPublication Type: Journal Article; Research Support, Non-U.S. Gov't; Research Support, U.S. Gov't, Non-P.H.S.; Review
650 0 4 _aCrystallization
_xmethods
650 0 4 _aElectrochemistry
_xinstrumentation
650 0 4 _aMolecular Conformation
650 0 4 _aNanostructures
_xanalysis
650 0 4 _aParticle Size
650 0 4 _aSemiconductors
650 0 4 _aSilicon
_xanalysis
650 0 4 _aSurface Properties
650 0 4 _aTitanium
_xanalysis
700 1 _aLou, Yongbing
700 1 _aDayal, Smita
700 1 _aQiu, Xiaofeng
700 1 _aKrolicki, Robert
700 1 _aBurda, Clemens
700 1 _aZhao, Chengfang
700 1 _aBecker, James
773 0 _tJournal of nanoscience and nanotechnology
_gvol. 5
_gno. 9
_gp. 1408-20
856 4 0 _uhttps://doi.org/10.1166/jnn.2005.310
_zAvailable from publisher's website
999 _c15824593
_d15824593