| 000 | 00801 a2200217 4500 | ||
|---|---|---|---|
| 005 | 20250514231019.0 | ||
| 264 | 0 | _c20050929 | |
| 008 | 200509s 0 0 eng d | ||
| 022 | _a0304-3991 | ||
| 024 | 7 |
_a10.1016/j.ultramic.2005.04.003 _2doi |
|
| 040 |
_aNLM _beng _cNLM |
||
| 100 | 1 | _aJungk, T | |
| 245 | 0 | 0 |
_aCritical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction. _h[electronic resource] |
| 260 |
_bUltramicroscopy _cOct 2005 |
||
| 300 |
_a206-19 p. _bdigital |
||
| 500 | _aPublication Type: Journal Article | ||
| 700 | 1 | _aWalther, T | |
| 700 | 1 | _aMader, W | |
| 773 | 0 |
_tUltramicroscopy _gvol. 104 _gno. 3-4 _gp. 206-19 |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1016/j.ultramic.2005.04.003 _zAvailable from publisher's website |
| 999 |
_c15596534 _d15596534 |
||